Other Analytical Methods Based on Emission, Absorption, and Scatter of X-Rays; Other Spectrometric Methods Involving X-Rays

Abstract

The x-ray secondary-emission spectrometer is an extremely versatile instrument and need not necessarily be operated in the mode for which it was designed. Use of the instrument for energy-dispersive (Section 8.2), nondispersive (Section 8.3), and selected-area (Chapter 19) analysis has already been described, and this chapter is devoted principally to still other modes of operation. Brief consideration is also given to some other spectrometric methods involving x-rays, but for which special instrumentation is required. Each of the methods summarized in this chapter would require a book of its own for adequate treatment. This chapter is intended only to give the x-ray spectrographer an elementary introduction to some analytical methods related to his field.