Abstract
The contrast in the scanning acoustic microscope may be described by the V(z) curve (1,2). The potential of the SAM lies in the fact that the V(z) curve is a strong function of the elastic properties of the material. It is thus possible to image elastic properties with spatial resolution of the order of a micron or better provided the incident radiation has a sufficiently small wavelength.
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© 1984 Plenum Press, New York
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Soumekh, M.G., Briggs, G.A.D., Ilett, C. (1984). The Origin of Grain Contrast in the Scanning Acoustic Microscope. In: Kaveh, M., Mueller, R.K., Greenleaf, J.F. (eds) Acoustical Imaging. Acoustical Imaging, vol 13. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-2779-0_10
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DOI: https://doi.org/10.1007/978-1-4613-2779-0_10
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