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Analysis of the Mobility of the Electronic Defects in Co1-δ0

  • G. Petot-Ervas
  • P. Ochin
  • T. O. Mason
Part of the NATO ASI Series book series (NSSB, volume 129)

Abstract

Analysis was made of the temperature and composition dependence of hole mobility in Co0 via a comparative study of conductivity and thermoelectric coefficient. The conductivity at constant thermopower appears to be activated. However the magnitude (≲0.1 eV) does not permit unambiguous confirmation of conduction mechanism. The oxygen exponents for conductivity and thermopower are, within experimental uncertainty, identical, i.e. no detectable composition dependence of the mobility. The values of the oxygen exponents obtained are consistent with defect clustering at high \({P_{{O_2}}}\).

Keywords

Oxygen Partial Pressure Conduction Mechanism Experimental Uncertainty Composition Dependence Hole Mobility 
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Copyright information

© Plenum Press, New York 1985

Authors and Affiliations

  • G. Petot-Ervas
    • 1
  • P. Ochin
    • 1
  • T. O. Mason
    • 2
  1. 1.P.M.T.M. LaboratoireC.N.R.S.VilletaneuseFrance
  2. 2.Department of Materials Science and EngineeringNorthwestern UniversityEvanstonUSA

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