Abstract
Transient photoconductivity has been widely exploited as a tool for determining transport properties of electrons and holes in both insulators and semiconductors.1 The transient excitation allows the experimenter to sort out trapping processes with different rate constants, and from transit times across device structures to determine carrier mobilities. Experiments are usually conducted under conditions where the photocarriers produced by the transient excitation are too few in number to perturb the local electric fields imposed by known applied voltages.
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References
J. Mort and D. M. Pai, “Photoconductivity and Related Phenomena”, Elsevier, New York, (1976).
P. S. Winokur and H. E. Boesch, Jr., Annealing of MOS Capacitors with Implications for Test Procedures to Determine Radiation Hardness, IEEE Trans. Nuc. Sci. NS-28: 4088, (1981).
N. F. Mott, Silicon Dioxide and the Chalcogenide Semiconductors; Similarities and Differences,Ad. in Physics 26:363, (1977).
A. G. Holmes-Seidle, The Space Charge Dosimeter; General Principles of a New Method of Radiation Detection, Nuc. Inst, and Methods 121:169 (1974).
R. Sokel and R. C. Hughes, Numerical Analysis of Transient Photoconductivity in Insulators, J. App. Phys. 53:7414 (1982).
R. C. Hughes and R. J. Sokel, Computation of Photoconductivity in Insulators in the Space Charge and Recombination Regime. Application to PbO Films, J. App. Phys. 52:6743 (1981).
R. C. Hughes, The Origin of Interfacial Charging in Irradiated SiN Capacitors, J. App. Phys. 56:1044 (1984).
R. C. Hughes and C. H. Seager, Hole Trapping, Recombination and Space Charge in Irradiated Sandia Oxides, IEEE Trans. Nuc. Sci. NS-30: 4049 (1983).
R. C. Hughes, E. P. Eernisse, and H. J. Stein, Hole Transport in MOS Oxides, IEEE Trans. Nuc. Sci. NS-225: 2227 (1975).
R. C. Hughes, High Field Electronic Properties of Si02, Solid State Electronics, 21: 251 (1978).
H. E. Boesch Jr.,, and J. M. McGarrity, Charge Yield and Dose Effects in MOS Capacitors at 80 K, IEEE Trans. Nuc. Sc. NS-23:1520 (1976).
N. S. Saks, M. G. Ancona, and J. A. Modolo, Radiation Effects in MOS Capacitors with Very Thin Oxides at 80 K, IEEE Trans. Nuc. Sci. NS-31: 1249 (1984).
R. C. Hughes, Bulk Recombination of Charge Carriers in Polymer Films, PVK:TNF,J. Chem. Phys. 58:2212 (1973).
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© 1985 Plenum Press , New York
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Hughes, R.C., Sokel, R. (1985). Transient Photoconductivity in Insulators at Very High Photocarrier Concentrations. In: Adler, D., Fritzsche, H., Ovshinsky, S.R. (eds) Physics of Disordered Materials. Institute for Amorphous Studies Series. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-2513-0_48
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DOI: https://doi.org/10.1007/978-1-4613-2513-0_48
Publisher Name: Springer, Boston, MA
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