Abstract
CMOS processes are generally more complex and expensive than nMOS processes because extra steps and extra masks are required in the fabrication process. Although many different processes are available, all the CMOS processes fall into either one of the two following classes:
-
Bulk processes: the substrate is doped silicon. Examples of bulk processes are p-well, n-well, and twin-tub. Newer bulk processes [18,32] can also have bipolar transistors on the same wafer, which has positive effects on driving capability — which is not as high in MOS as in bipolar technology — and when digital/analog applications — such as sense amplifiers in memory design [17] — are considered.
-
Silicon-on-insulator (SOI) processes: the substrate is an insulator, such as sapphire (“silicon-on-sapphire,” SOS) or silicon dioxide (SiO2).
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Adams, J.R. and R.J. Sokel. Neutron Irradiation for Prevention of Latch-up in MOS Integrated Circuits. IEEE Trans. on Nuclear Science NS-26(6): 5069–5073, 1979.
Anagnostopoulos, C.N. et al.. Latch-Up and image Crosstalk Suppression by Internal Gettering. IEEE Journal of Solid State Circuits SC-19(1):91–97, February, 1984.
Appels, J.A. and M.M. Paffen. Local Oxidation of Silicon. Philips Res. Reports 26: 157–165, 1971.
Brandt, B.B.M., W. Steinmaier and A.J. Strachan. LOCMOS, a New Technology for Complementary MOS Circuits. Philips Technical Review 34 (1): 19–23, 1974.
Chatterjee, P. Device Design Issues for Deep Submicron VLSI. In Proc. of the 1985 International Symposium on VLSI Technology, Systems and Applications — Taiwan, pages 221–226. May, 1985.
Chen, M.-L., B.C. Leung and B. Lalevic. A High-performance CMOS/SOS Device with a Gradually Doped Source-Drain Extension Structure. IEEE Electrons Device Letters EDL-4(10):372–374, October, 1983.
Elmasry, M.I. Digital Bipolar Integrated Circuits. John Wiley & Sons, 1983.
Estreich, D.B., A. Ochoa and R.W. Dutton. An Analysis of Latch-up Prevention in CMOS IC’s Using an Epitaxial Buried Layer Process. In IEDM Tech. Dig.. December, 1978.
Genda, J.H. An Improved Model for Latch-up in CMOS Structures. In Proc. of the 1983 International Symposium on VLSI, Technology, Systems and Applications — Taiwan, pages 99–103. April, 1983.
Hashimoto, K. et al.. Counter-doped Well Structure for Scaled CMOS. In IEDM Tech. Dig.. December, 1982.
Isobe, M. et al.. An 18 ns CMOS/SOS 4K Static RAM. IEEE Journal of Solid State Circuits SC-16(5):460–465, October, 1981.
Lam, H.W. Silicon on Insulating Substrates — Recent Advances. In IEDM Tech. Dig., pages 348–351. 1983.
Lim, H.K. and J.G. Fossum. A Charge-Based Large-Signal Model for Thin-Film SOI MOSFET’s. IEEE Journal of Solid State Circuits SC-20(1):366–377, February, 1985.
Manoliu et al. High-Density and Reduced Latchup Susceptibility CMOS Technology for VLSI. IEEE Electron Device Letters EDL-4(7):240–245, July, 1983.
Mayer, D.C. et al. A Short-Channel CMOS/SOS Technology in Recrystallized 0.3-μm-Thick Silicon-on-Sapphire Films. IEEE Electron Device Letters EDL-5(5):156–158, May, 1984.
Mead, C. and L. Conway. Introduction To VLSI Systems. Addison-Wesley Publishing Co., Reading, Mass., 1980.
Miyamoto, J.I. et al.. A High-Speed 64K CMOS RAM with Bipolar Sense Amplifiers. IEEE Journal of Solid-State Circuits SC-19(5):557–563, October, 1984.
Momose, H. et al.. 1.0μm n-Well CMOS/Bipolar Technology. IEEE Journal of Solid State Circuits SC-20(1):137–143, February, 1985.
Ong, DeW.G. Modern MOS Technology. McGraw-Hill Book Co., 1984.
Parrillo, L.C. et al.. Twin-Tub CMOS — A Technology for VLSI Circuits. In IEEE Int. Electron Device Meeting. 1980.
Pattanayak, D.N. et al. Switching Conditions for CMOS Latch-Up Path with Shunt Resistances. IEEE Electron Device Letters EDL-4(4):116–119, April, 1983.
Payne, R.S., W.N. Grant and W.J. Bertram. Elimination of Latch Up in Bulk CMOS. In Proc. of the international Electron Device Meeting, pages 248–251. IEEE, 1980.
Pinto, M.R. and R.W. Dutton. Accurate Trigger Condition Analysis for CMOS Latchup. IEEE Electron Device Letters EDL-6(2):100–102, February, 1985.
Preckshot, N.E. et al.. Design Methodology of a 1.2-μm Double-Level-Metal CMOS Technology. IEEE Journal of Solid State Circuits SC-19(1):81–90, February, 1984.
Soden, J.M., H.D. Stewart and R.A. Pastorek. ESD Evaluation of Radiation-hardened, High Reliability CMOS and MNOS ICs. In Proc. EOS/ESD Symposium, pages 134–146. Reliability Analysis Center, September, 1983.
Sugino, M., L.A. Akers and M.E. Rebeschini. Latchup-Free Schottky-Barrier CMOS. IEEE Trans, on Electron Devices: 110–118, 1983.
Sze, S.M. Physics of Semiconductor Devices. John Wiley & Sons, New York, 1969.
Sze, S.M. (ed.). VLSI Technology. McGraw-Hill Publishing Co., 1983.
Tanaka, S. et al.. A Subnanosecond 8K-Gate CMOS/SOS Gate Array. IEEE Journal on Solid State Circuits SC-19(5):657–662, October, 1984.
Troutman, R.R. and H.P. Zappe. A Transient Analysis of Latchup in Bulk CMOS. IEEE Trans, on Electron Devices ED-30(2):170–179, February, 1983.
Vittoz, E.A. MOS Transistors Operated in the Lateral Bipolar Mode and Their Application in CMOS Technology. IEEE Journal of Solid State Circuits SC-18(3):273–279, June, 1983.
Walezyk, I. and J. Rubinstein. A Merged CMOS/Bipolar VLSI Process. In IEDM Technical Digest. December, 1983.
White, M.H. Characterization of CMOS Devices for VLSI. IEEE Journal of Solid-State Circuits SC-17(2):208–214, April, 1982.
Wieder, A.W., C. Werner and J. Harter. Design Model for Bulk CMOS Scaling Enabling Accurate Latchup Prediction. IEEE Trans. on Electron Devices ED-30(3):240–245, March, 1983.
Wu, C.Y. and M.Z. Lin. The Modified Bimos Dynamic RAM Cell Using LOCOS and N-Well Technologies. In Proc. of the International Symposium on VLSI Technology, Systems and Applications, pages 267–269. March, 1983.
Yamaguchi, T. et al.. Process and Device Performance of 1 μm-Channel n-Well CMOS Technology. IEEE Journal of Solid State Circuits SC-19(1):71–80, February, 1984.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1986 Kluwer Academic Publishers
About this chapter
Cite this chapter
Annaratone, M. (1986). Fabrication Processes. In: Digital CMOS Circuit Design. The Kluwer International Series in Engineering and Computer Science, vol 16. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-2285-6_3
Download citation
DOI: https://doi.org/10.1007/978-1-4613-2285-6_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-9409-2
Online ISBN: 978-1-4613-2285-6
eBook Packages: Springer Book Archive