Abstract
X-ray microscopy can be used for investigations in the fields of biology, medicine, physics, especially materials science and probably other fields. as e.g. polymer science. In biology, it is possible to investigate specimens with a thickness of up to several microns, especially living cells and cell organelles in a natural state. For such investigations, the wavelength region between 2.3 nm and 4.4 nm is best suited because there is about an order of magnitude difference between the absorption coefficients for water and protein. This difference provides a natural contrast mechanism for the investigation of wet biological materials.
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References
G. Schmahl, D. Rudolph, P.Guttmann and 0. Christ, Zone Plates for X-Ray Microscopy, in: “X-Ray Microscopy”, G. Schmahl, D. Rudolph, eds., Springer Series in Optical Sciences, Vol. 43, Springer-Verlag, Heidelberg (1984), p.63–74
P. Guttmann, Construction of a Micro Zone Plate and Evaluation of Imaging Properties, ibid., p.75–90
J. Thieme, Construction of Condenser Zone Plates for a Scanning X-Ray Microscope, ibid., p.91–96
M. Born, E. Wolf, “Principles of Optics”, Sixth Edition, Pergamon Press, Oxford (1980)
P. Guttmann, “Theoretische Untersuchungen über hochauflösende Zonenplatten als abbildende Systeme für weiche Röntgenstrahlung”, Diplomarbeit, Universität Göttingen (1982)
J. Thieme, “Theoretische Untersuchungen über Kondensorzonenplatten als abbildende Systeme für weiche Röntgenstrahlung”, Diplomarbeit, Universität Göttingen (1984)
B. Niemann, D. Rudolph, G. Schmall, Opt. Commun. 12 (1974), 160–163
G. Joos, “Lehrbuch der Theoretischen Physik”, 11. Auflage, Akademischer Verlag, Frankfurt (1959)
D. Rudolph, B. Niemann, G. Schmahl and 0. Christ, The Göttingen X-Ray Microscopy Experiments at the BESSY storage ring, in: “X-Ray Microscopy”, G. Schmahl, D. Rudolph, eds., Springer Series in Optical Sciences, Vol. 43 Springer Verlag, Heidelberg (1984), p. 192–202
B. Niemann, The Göttingen Scanning X-Ray Microscope, ibid., p.217–225
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© 1986 Plenum Press, New York
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Schmahl, G., Rudolph, D., Niemann, B., Guttmann, P., Thieme, J. (1986). Lenses for Soft X-Rays and X-Ray Microscopy Experiments. In: Feder, R., McGowan, J.W., Shinozaki, D.M. (eds) Examining the Submicron World. NATO ASI Series, vol 137. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-2209-2_13
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DOI: https://doi.org/10.1007/978-1-4613-2209-2_13
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