Abstract
The previous chapter described the utility of using general methods based on logic for representing and reasoning about designs, and illustrated the reasoning procedures for simulation, diagnosis, and test generation. In this chapter we will present a more detailed discussion of the test generation task. We will concentrate on the control issues for increasing the efficiency of the reasoning process, and ignore the details of the representation and inference procedures which were described in the previous chapter.
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© 1987 Kluwer Academic Publishers
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Singh, N. (1987). Test Generation. In: An Artificial Intelligence Approach to Test Generation. The Kluwer International Series in Engineering and Computer Science, vol 19. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1979-5_4
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DOI: https://doi.org/10.1007/978-1-4613-1979-5_4
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-9183-1
Online ISBN: 978-1-4613-1979-5
eBook Packages: Springer Book Archive