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Acoustic Microscopy Using Amplitude and Phase Measurements

  • P. Reinholdtsen
  • B. T. Khuri-Yakub
Conference paper
Part of the Review of Progress in Quantitative Nondestructive Evaluation book series (RPQN, volume 6 A)

Abstract

We have built a low-frequency scanning acoustic microscope (SAM) that measures both amplitude and phase. The majority of SAMs simply measure the amplitude of the reflected signal. Measuring the phase gives a great deal more information. For one thing, the phase is very sensitive to height variations. Measuring the phase also gives us the ability to do signal processing on the resulting images, such as removing the effects of surface features from defocused images of subsurface defects.

Keywords

Fuse Quartz Tone Burst Acoustic Image Shallow Depression Acoustic Microscope 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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    D. H. Kerns, J. Acoust. Soc. America 57 (2) (February 1975).Google Scholar
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    K. K. Liang, G. S. Kino, and B. T. Khuri-Yakub, IEEE Sonics & Ultrasonics SU-32 (2), 213 (March 1985).CrossRefGoogle Scholar
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    P. Reinholdtsen, W. W. Hipkiss, and B. T. Khuri-Yakub, Review of Progress in Quantitative Nondestructive Evaluation, D. O. Thompson and D. E. Chimenti, Eds., Plenum Press, 263 (1985).Google Scholar
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    See IEEE Trans, on Sonics and Ultrasonics, Special Issue on Acoustic Microscopy SU-32 (2), (March 1985 ).Google Scholar

Copyright information

© Springer Science+Business Media New York 1987

Authors and Affiliations

  • P. Reinholdtsen
    • 1
  • B. T. Khuri-Yakub
    • 1
  1. 1.Edward L. Ginzton Laboratory W. W. Hansen Laboratories of PhysicsStanford UniversityStanfordUSA

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