Skip to main content

Part of the book series: The Kluwer International Series in Engineering and Computer Science ((SECS,volume 109))

  • 122 Accesses

Abstract

An idealized MESFET (metal-semiconductor field effect transistor) structure is shown in Fig. 2.1.1. An active layer of n-type GaAs is grown on top of a semi-insulating GaAs substrate. The drain and source electrodes make contact with the active layer through an n+ region under each. A third electrode, which is the gate, is placed directly on the active layer. From consideration of the energy band diagram at the metal-semiconductor interface, we find there is a depletion region under the gate whose height is controlled by a transverse electric field created by an applied gate voltage V G. The undepleted region is called the channel. When a positive voltage V D is applied to the drain with respect to the source, a longitudinal electric field is created that accelerates electrons in the channel from the source towards the drain. The resulting current in the channel, called the drain current, will depend on the gate voltage and the drain to source voltage. A MESFET is therefore a three-terminal device whose drain to source current is controlled by the voltage on the third electrode.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. S. Sze, Physics of Semiconductor Devices. Wiley Interscience, 1981. Chapter 5.

    Google Scholar 

  2. A. B. Grebene and S. K. Ghandhi, “General theory for pinched operation of the junction-gate FET,” Solid State Electronics, Vol. 12, 1969, pp. 573–89.

    Article  Google Scholar 

  3. E. N. Trofimenkoff, “Field-dependent mobility analysis of the FET,” Proceedings of the IEEE, Vol. 53, no. 11, November 1965, pp. 1765–66.

    Article  Google Scholar 

  4. R. A. Pucel, H. A. Haus, and H. Statz, “Signal and noise properties of GaAs microwave field effect transistors,” Advances in Electronics and Electron Physics, L. Marton, Ed., vol. 38. New York: Academic, 1975, pp. 195–265.

    Google Scholar 

  5. A. Chandra, private communication.

    Google Scholar 

  6. N. G. Alexopoulo, J. A. Maupin, P. T. Greiling, “Determination of the electrode capacitance matrix for GaAs FETs,” IEEE Transactions on Microwave Theory and Techniques, Vol. MTT-28, No. 5, May 1980, pp. 459–466.

    Article  Google Scholar 

  7. H. Statz, P. Newman, I.W. Smith, R. A. Pucel, and H. A. Haus, “GaAs FET device and circuit simulation in SPICE,” IEEE Transactions on Electron Devices, Vol. ED-34, No. 2, February 1987, pp. 160–169.

    Article  Google Scholar 

  8. M. Shur, GaAs Devices and Circuits. New York: Plenum Press, 1987, p. 318.

    Google Scholar 

  9. D. E. Ward, “Charge-based modelling of capacitance in MOS transistors,” Ph.D. dissertation, Integrated Circuits Laboratory, Stanford University, Technical Report G201-11, June 1981.

    Google Scholar 

  10. J. M. Golio, J. R. Hauser, and P. A. Blakey, “A large-signal GaAs MESFET Model implemented on SPICE,” IEEE Circuits and Devices Magazine, September 1985, pp. 21–29.

    Google Scholar 

  11. S. J. Lee, C. P. Lee, E. Shen, and G.R. Kaelin, “Modeling of backgating effects on GaAs digital integrated circuits,” IEEE Journal of Solid State Circuits, April 1984, pp. 245–50.

    Google Scholar 

  12. C-S Chang and D-Y Day, “Analytic theory for current-voltage characteristics and field distribution of GaAs MESFETs,” IEEE Transactions on Electron Devices, Vol. 36, No. 2, February 1989, pp. 269–80.

    Article  Google Scholar 

  13. Y-K Feng and A. Hintz, “Simulation of submicron GaAs MESFET’s using a full dynamic transport model,” IEEE Transactions on Electron Devices, Vol 35, No. 9, September 1988, pp. 1419–31.

    Article  Google Scholar 

  14. H. C. Ki, S. H. Son, K Park, and K. D. Kwack, “A three-section model for computing I-V characteristics of GaAs MESFETs,” IEEE Transactions on Electron Devices, Vol. 34, No. 9, September 1987, pp. 1929–33.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1990 Kluwer Academic Publishers

About this chapter

Cite this chapter

Wing, O. (1990). Circuit Models of the MESFET. In: Gallium Arsenide Digital Circuits. The Kluwer International Series in Engineering and Computer Science, vol 109. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1541-4_2

Download citation

  • DOI: https://doi.org/10.1007/978-1-4613-1541-4_2

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-8826-8

  • Online ISBN: 978-1-4613-1541-4

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics