Abstract
The majority of x-ray imaging experiments currently use the contact technique or x-ray analogues of the optical microscope, either in direct imaging or scanning mode, as described in Chapters 4−6. It is also possible, however, to obtain sample information by exploitation of the diffracted field, as is done in crystallography. To do this a method for determining and using the phases of the diffracted wave is needed. In the soft x-ray region, holography is one way to provide such a method. Other ways have been proposed by Sayre.1
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Using the latest soft x-ray undulator beamline (XI) at the NSLS, which began operations in late 1988, the hologram recording time has come down to about 3 minutes.
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Howells, M.R., Jacobsen, C., Kirz, J., McQuaid, K., Rothman, S.S. (1990). Progress and Prospects in Soft X-Ray Holographic Microscopy. In: Duke, P.J., Michette, A.G. (eds) Modern Microscopies. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1467-7_7
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DOI: https://doi.org/10.1007/978-1-4613-1467-7_7
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