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Posbist Reliability Theory in Terms of System Lifetimes

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Introduction to Fuzzy Reliability

Part of the book series: The Kluwer International Series in Engineering and Computer Science ((SECS,volume 363))

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Abstract

Posbist reliability theory is based on the possibility assumption and the binary-state assumption [2]:

  1. A1’.

    Possibility assumption: the system failure behavior is fully characterized in the context of possibility measures.

  2. A2’.

    Binary-state assumption: the system demonstrates only two crisp states: fully functioning or fully failed. At any time the system is in one of the two states.

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References

  1. R.E. Barlow, F. Proschan, Statistical Theory of Reliability and Life Testing: Probability Models, Holt, Rinehart and Winston, 1975.

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  2. K.Y. Cai, C.Y. Wen, M.L. Zhang, “Fuzzy Variables as a Basis for a Theory of Fuzzy Reliability in the Possibility Context”, Fuzzy Sets and Systems, Vol.42, 1991, pp145–172.

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  3. K.Y. Cai, C.Y. Wen, M.L. Zhang, “Posbist Reliability Behavior of Fault-Tolerant Systems”, Microelectronics and Reliability, Vol.35, No.1, 1995, pp49–56.

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© 1996 Kluwer Academic Publishers

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Cai, KY. (1996). Posbist Reliability Theory in Terms of System Lifetimes. In: Introduction to Fuzzy Reliability. The Kluwer International Series in Engineering and Computer Science, vol 363. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1403-5_6

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  • DOI: https://doi.org/10.1007/978-1-4613-1403-5_6

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-8608-0

  • Online ISBN: 978-1-4613-1403-5

  • eBook Packages: Springer Book Archive

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