Background

  • Jitendra B. Khare
  • Wojciech Maly
Part of the Frontiers in Electronic Testing book series (FRET, volume 5)

Abstract

In this chapter, we briefly discuss previous attempts at modeling contamination in IC manufacturing and its effect on yield modeling. The relevance of these models in modern manufacturing environments is also discussed.

Keywords

Extractor Univer Estima Lawson Mellon 

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Copyright information

© Kluwer Academic Publishers 1996

Authors and Affiliations

  • Jitendra B. Khare
    • 1
  • Wojciech Maly
    • 1
  1. 1.Carnegie Mellon UniversityUSA

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