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Introduction

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From Contamination to Defects, Faults and Yield Loss

Part of the book series: Frontiers in Electronic Testing ((FRET,volume 5))

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Abstract

Over the years, there has been a large increase in functionality available on a single integrated circuit. From 2,300 transistors on a chip in 1971 [1], the state-of-the art designs of today have progressed to about 5 million transistors [2], [3]. The number of transistors on a single die has approximately doubled every two years, as predicted by Moore’s law [4].

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Authors and Affiliations

  1. Carnegie Mellon University, USA

    Jitendra B. Khare & Wojciech Maly

Authors
  1. Jitendra B. Khare
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  2. Wojciech Maly
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© 1996 Kluwer Academic Publishers

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Khare, J.B., Maly, W. (1996). Introduction. In: From Contamination to Defects, Faults and Yield Loss. Frontiers in Electronic Testing, vol 5. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1377-9_1

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  • DOI: https://doi.org/10.1007/978-1-4613-1377-9_1

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-8595-3

  • Online ISBN: 978-1-4613-1377-9

  • eBook Packages: Springer Book Archive

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