Abstract
This paper proposes a robust method for matching labeled point patterns. A point pattern is partitioned into a set of triangles using the Delaunay triangulation. For the corresponding triangle pair, a consistency graph is constructed based on the pairwise compatibility between the points in the triangles. The matching is accomplished by locating the largest maximal clique of the consistency graph. A new method for detecting corners is also proposed, based on the local symmetry of a discrete curve. The corners are used as the feature points in point pattern representation and matching of the line drawings.
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© 1988 Plenum Press, New York
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Ogaxtfa, H. (1988). Point Pattern Matching and Corner Finding For Line Drawings. In: Cantoni, V., Di Gesù, V., Levialdi, S. (eds) Image Analysis and Processing II. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1007-5_26
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DOI: https://doi.org/10.1007/978-1-4613-1007-5_26
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-8289-1
Online ISBN: 978-1-4613-1007-5
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