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Correlation of Thin-Film Bond Compliance and Bond Fracture Resistance

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Review of Progress in Quantitative Nondestructive Evaluation

Abstract

The integrity of the interfacial bond between a coating and its substrate is of primary importance for any application. A technique for the quantitative nondestructive measurement of the bond fracture energy is essential for evaluating bond integrity. Scanning acoustic microscopy (SAM) provides a method for making localized measurements of film dis-bonds and film bond compliance based on the changes in the surface acoustic wave velocity in the layered medium. The results of these measurements for chrome/gold and gold films on glass substrates are summarized. The compliance of the bond and its fracture energy can be correlated in some film systems. An experiment to determine if this correlation exists for chrome/gold and gold films on sapphire substrates is described. Results of such an experiment would provide an empirical correlation between surface acoustic wave velocity measurements and the fracture energy of the film. The results of an experiment to measure the fracture energy of the interfacial bond between a gold film and the sapphire substrate are described.

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References

  1. K. L. Mittal, “Adhesion measurements of thin films,” Electrocomp. Sci. Technol. vol. 3, pp. 21–42, 1976.

    CAS  Google Scholar 

  2. K. L. Mittal, “A critical appraisal of the methods for measuring adhesion of electrodeposited coatings,” in Properties of Electro-deposits: Their Measurement and Significance, ed. R. Sard, H. Leidheiser Jr., and F. Ogburn, Chapter 17, pp. 273–306, The Electrochemical Society, Princeton, New Jersey, 1975.

    Google Scholar 

  3. C. Weaver, “Adhesion of thin films,” J. Vac. Sci. Technol., vol. 12, pp. 18–25, 1975.

    Article  CAS  Google Scholar 

  4. D. S. Campbell, “Mechanical properties of thin films,” in Handbook of Thin Film Technology, ed. L. I. Maissel and R. Glang, Chapter 12, McGraw Hill Book Company, New York, 1970.

    Google Scholar 

  5. J. Kushibiki and N. Chubachi, “Material characterization by line-focus-beam acoustic microscope,” IEEE Trans Sonics Ultrason., vol. SU-32, pp. 189–212, 1985.

    Google Scholar 

  6. R.C. Addison Jr., M. Somekh, and G.A.D. Briggs, “Techniques For The Characterization Of Film Adhesion,” 1986 Ultrasonics Symposium Proceedings, pp. 775–782, IEEE, 1987. IEEE cat # 86CH2375–4

    Google Scholar 

  7. A. Atalar, “An angular spectrum approach to contrast in the reflection acoustic microscope,” J. Appl. Phys., vol. 49, pp. 5130–5139, 1978.

    Article  CAS  Google Scholar 

  8. R. D. Weglein, “A model for predicting acoustic material signatures,” Appl. Phys. Lett., vol. 34, pp. 179–181, 1979.

    Article  CAS  Google Scholar 

  9. S. S. Chiang, D. B. Marshall, and A. G. Evans, “A Simple Method For Adhesion Measurements,” in Surfaces and Interfaces in Ceramic and Ceramic-Metal Systems, ed. J. A. Pask and A. G. Evans, vol. 14, pp. 603–617, Plenum, New York, 1981.

    Google Scholar 

  10. D. B. Marshall and A. G. Evans, “Measurement of adherence of residually stressed thin films by indentation. I. Mechanics of interface delamination,” J. Appl. Phys., vol. 56, pp. 2632–2638, 1984.

    Article  CAS  Google Scholar 

  11. R. C. Bray, “Acoustic and photoacoustic microscopy,” Ph.D. Thesis, Stanford University, 1981.

    Google Scholar 

  12. R. B. Thompson and C. J. Fiedler, “The effects of crack closure on ultrasonic scattering measurements,” in Review of Progress in QUANTITATIVE NONDESTRUCTIVE EVALUATION v.3, ed. D. O. Thompson and D.E. Chimenti, pp. 207–215, Plenum Press, N.Y., 1984.

    Google Scholar 

  13. M. Punjani and L. J. Bond, “Scattering of plane waves by a partially closed crack,” in Review of Progress in QUANTITATIVE NONDESTRUCTIVE EVALUATION v.5, ed. D.O. Thompson and D.E. Chimenti, pp. 61–71, Plenum Press, N.Y., 1986.

    Google Scholar 

  14. B. R. Lawn and T. R. Wilshaw, “Indentation Fracture: Principles And Applications,” J. Mater. Sci., vol. 10, pp. 1049–1081, 1975.

    Article  Google Scholar 

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© 1988 Plenum Press, New York

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Addison, R.C., Marshall, D.B. (1988). Correlation of Thin-Film Bond Compliance and Bond Fracture Resistance. In: Thompson, D.O., Chimenti, D.E. (eds) Review of Progress in Quantitative Nondestructive Evaluation. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0979-6_37

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  • DOI: https://doi.org/10.1007/978-1-4613-0979-6_37

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-8275-4

  • Online ISBN: 978-1-4613-0979-6

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