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Multipole Lenses

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Electron and Ion Optics

Part of the book series: Microdevices ((MDPF))

Abstract

In Chapters 4, 5, 7, a n d 8 the optical properties of axially symmetric fields were considered in detail. As we know, such fields have the property of stigmatic imaging in the first-order approximation, i.e., a point-to-point correspondence between the object and the image. This property is absolutely necessary for the purposes of electron microscopy. There are, however, many applications (e.g., particle accelerators, spectrometers, vacuum tubes, and, in general, even electron and ion probes) where stigmatic imaging is not required. Indeed, the role of beam optics for particle accelerators is just t o keep the beam together, analyze its parameters, and guide it to the experiments. No image has to be formed in this case.

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© 1988 Plenum Press, New York

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Szilagyi, M. (1988). Multipole Lenses. In: Electron and Ion Optics. Microdevices. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0923-9_10

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  • DOI: https://doi.org/10.1007/978-1-4613-0923-9_10

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-8247-1

  • Online ISBN: 978-1-4613-0923-9

  • eBook Packages: Springer Book Archive

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