Abstract
In Chapter 4, we discussed negative photoresist compositions and polymeric factors which affect resolution; in Chapter 3, we considered exposure tools and radiation chemistry principles; and in Chapter 10, we discuss the swelling of negative resists in a developer. These chapters form the principal backgrounds for the processing aspects of negative radiation resists.
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Moreau, W.M. (1988). Negative Radiation Resists. In: Semiconductor Lithography. Microdevices. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0885-0_5
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