Abstract
This instrument has been subject to continuous development over the past. 20 years1 to the point where it is used successfully in many applications ranging from sophisticated chemical analysis to general vacuum monitoring*. It is, in fact, the most extensively used mass spectrometer in high- and ultra-high vacuum systems for routine gas analysis. In its simple form it has become recognized as a reliable and easy-to-use instrument in the heavy industrial, as well as the research, laboratory. The description of this quadrupole mass spectrometer (or mass filter), often referred to as the residual gas analyser (RGA), and its use in the general vacuum laboratory is emphasized in this chapter. In many applications these RGA mass spectrometers substitute for the ionization gauge, in effect covering the same pressure range but with the advantage of indicating the partial pressure of the main constituents in the vacuum system. The geometry of the quadrupole mass spectrometer is very similar to that of the extractor ionization gauge developed by Pittaway2 (described in detail in Chapter 3, section 3.5), with a mass filter interposed between source and collector. The filter is an electrostatic lens consisting of an array of four parallel rods arranged symmetrically around a central axis along which the ions travel. The ‘quadrupole’ structure is illustrated in Figure 7.1 which shows that the inner surfaces of the electrodes have hyperbolic profiles. The principles of using quadrupole magnetic or electric fields for ion beam control were developed before the application to the mass filter3−5.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Dawson, P.H. (ed.) (1976) Quadrupole Mass Spectrometry and its Applications. Elsevier, Amsterdam 1976.
Pittaway, L.G. (1974) Vacuum 24, 301.
Courant, E.D., Livingston, M.S. and Snyder, H.S. (1952) Phys. Rev. 88, 1190.
Blewett, J.P. (1952) Phys. Rev. 88, 1197.
Paul, W. and Steinwedel, H. (1953) Z. Naturforsch A8, 448.
Paul, W. and Steinwedel, H. (1956) Ger. Pat. 944, 900; (1960) US Pat. 2, 939, 952.
Paul, W., Reinhard, H.P. and von Zahn, U. (1958) Z. Phys. 152, 143.
Batey, J.H. (1987) Vacuum 37, 659.
Dawson, P.H. (1986) J. Vac. Sci. Technol. A4, 1709.
Brubaker, W.M. (1970) NASA Rept. NASW 1298.
Holme, A.E., Thatcher, W.J. and Leck, J.H. (1972) J. Phys. E. 5, 429.
Pittaway, L.G. (1974) Vacuum 24, 301.
Dennison, D.R. (1971) J. Vac. Sci. Technol. 8, 266.
Brubaker, W.M. (1968) Adv. Mass Spectrom. 4, 293.
Fite, W.L. (1976) Rev. Sci. Instrum. 47, 326.
Blanchard, W.R., McCarthy, P.J., Dylla, H.F., La Marche, P.H. and Simpkins, J.E. (1986) J. Vac. Sci. Technol. A4, 1715.
Hu, B. and Qiu, J. (1987) J. Vac. Sci. Technol. A5, 2657.
Holme, A.E., Thatcher, W.T. and Leck, J.H. (1972) Vacuum 22, 327.
Watanabe, F. and Ishimaru, H. (1986) J. Vac. Sci. Technol. A4, 1720.
Holme, A.E. (1972) PhD Thesis, University of Liverpool.
Reid, R.J. and James, A.P. (1987) Vacuum 37, 339.
Mao, F.M., Yang, J.M., Austin, W.E. and Leek, J.H. (1987) Vacuum 37, 335.
Calcatelli, A., Bergoglio, M. and Rumiano, G. (1987) J. Vac. Sci. Technol. A5, 2464.
Mao, F.M. and Leek, J.H. (1987) Vacuum 37, 669.
Arnold, W. (1970) J. Vac. Sci. Technol. 7, 191.
Holme, A.E., Thatcher, W.J. and Leck, J.H. (1972) J. Phys. E. 5, 429.
Story, M.S. (1967) J. Vac. Sci. Technol. 4, 326.
Munro, D.F. (1967) Rev. Sci. Instrum. 38, 1532.
Fairburn, A.R. (1969) Rev. Sci. Instrum. 40, 380.
Reagan, N.R., Frees, L.C. and Gray, J.W. (1987), J. Vac. Sci. Technol. A5, 2389.
Goodings, J.M., Jones, J.M. and Parkes, D.A. (1972) Int. J. Mass Spectrom. Ion Phys. 9, 417.
Benninghoven, C., Plog, C. and Treitz, N. (1974) Int. J. Mass Spectrom. Ion Phys. 13, 415.
Richards, J.A., Huey, R.M. and Hiller, J. (1973) Int. J. Mass Spectrom. Ion Phys. 12, 317.
Hayashi, T. and Sakudo, N. (1969) Proc. Int. Conf. Mass Spectrom. Kyoto, Japan.
Brinkmann, U. (1972) Int. J. Mass. Spectrom. Ion Phys. 9, 161.
Holme, A.E. (1976) Int. J. Mass Spectrom. Ion Phys. 22, 1.
Holme, A.E., Sayyid, S. and Leck, J.H. (1978) Int. J. Mass Spectrom. Ion Phys., 26, 191.
Ross, D.N. and Leek, J.H. (1983) Int. J. Mass Spectrom. Ion Phys., 49, 1.
Yang, J. and Leck, J.H. (1982) Vacuum 32, 691.
Yang, J. and Leck, J.H. (1984) Int. J. Mass Spectrom. Ion Processes 60, 127.
Dawson, P.H., Meunier, M. and Tam, Wing-Cheung (1980) Adv. Mass Spectro. 8B, 1629.
von Zahn, U. (1963) Rev. Sci. Instrum. 34, 1.
Grande, R.E., Watters, R.L. and Hudson, J.B. (1966) J. Vac. Sci. Technol. 3, 329.
Herzog, R.F. (1976) in Quadrupole Mass Spectrometry and its Applications,ed. Dawson, P.H., Elsevier, Amsterdam, chapter 7.
Fischer, E. (1959) Z. Phys. 156, 26.
Rettinghaus, G. (1967) Z. Angew. Phys. 22, 321.
Dawson, P.H. and Whetten, N.R. (1968) J. Vac. Sci. Technol. 5, 11.
Dawson, P.H., Hedman, J. and Whetten, N.R. (1969) Rev. Sci. Instrum. 40, 1444.
Dawson, P.H. and Lambert, C. (1974) Int. J. Mass Spectrom. Ion Phys. 14, 339.
Stafford, G.C., Kelley, P.E., Syka, J.E.P., Reynolds, W.E. and Todd, J.F.J. (1984) Int. J. Mass Spectrom. Ion Processes 60, 85.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1989 Blackie & Son Ltd.
About this chapter
Cite this chapter
Leck, J.H. (1989). Gas analysis in vacuum systems: quadrupole mass analysers. In: Total and Partial Pressure Measurement in Vacuum Systems. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0877-5_7
Download citation
DOI: https://doi.org/10.1007/978-1-4613-0877-5_7
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-8224-2
Online ISBN: 978-1-4613-0877-5
eBook Packages: Springer Book Archive