Skip to main content

Gas analysis in vacuum systems: magnetic, crossed-field and time-of-flight analysers

  • Chapter
Total and Partial Pressure Measurement in Vacuum Systems
  • 156 Accesses

Abstract

The significance of gas analysis in vacuum systems is becoming more important as increasing demands are made upon the system designer. Some form of mass spectrometer capable of measuring the partial pressure of all the constituent gases and vapours from 10−4 mbar down to below 10−10 mbar should be attached to the system. Care must be taken to ensure that this instrument does not significantly modify the pressure equilibria. Mass spectrometers suitable for this work are ionization gauges in which positive ions formed by electron bombardment are resolved into a mass spectrum, the intensity of each component being measured separately. None of the instruments so far developed gives a true gas analysis, as all suffer from three fundamental disadvantages:

  1. (i)

    They resolve into an ‘ion mass’ spectrum, not a ‘gas composition’ spectrum. For example, the gases nitrogen, carbon monoxide and ethylene all have their most intense signal at mass 28 amu (on the O = 16 atomic scale). Also, many gases, for example large organic molecules, give complex ion patterns which are not readily distinguishable. (See Figure 6.11, which presents the ion spectrum of butane, a relatively simple hydrocarbon.)

  2. (ii)

    The sensitivity, as in all ionization gauges, is different for each gas, and unfortunately the relative sensitivity between gases is a function of the individual instrument design and operation.

  3. (iii)

    The resolution of the mass spectrometer is not perfect; it usually decreases at the high end of the mass scale. In general, for a particular instrument an improvement in resolution is obtained only at the expense of a reduction in sensitivity.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Yarwood, J. (1959) Br. J. Appl. Phys. 10, 383.

    Article  Google Scholar 

  2. Bleakney, W. and Hippie, J.A. (1938) Phys. Rev. 57, 521.

    Article  Google Scholar 

  3. Mariner, T. and Bleakney, W. (1949) Rev. Sci. Instrum. 20, 297.

    Article  Google Scholar 

  4. Robinson, C.F. and Hall, L.G. (1956) Rev. Sci. Instrum. 27, 504.

    Article  Google Scholar 

  5. Huber, W.K. and Trendelenberg, E.A. (1961) Vac. Symp. Trans. Amer. Vac. Soc. 1, Pergamon, New York, 592.

    Google Scholar 

  6. Perkins, G.D. and Charpentier, D.E. (1957) Vac. Symp. Trans. Amer. Vac. Soc., Pergamon, New York, 125.

    Google Scholar 

  7. Kornelsen, E.V. (1959) Proc. 19th Physical Electronics Conj, M.I.T., Cambridge, Mass.

    Google Scholar 

  8. Hippie, J.A., Sommer, H. and Thomas, H.A. (1949) Phys. Rev. 76, 1877.

    Article  Google Scholar 

  9. Alpert, D. and Buritz, R.S. (1954) J. Appl. Phys. 25, 202.

    Article  Google Scholar 

  10. Sommer, H., Thomas, H.A. and Hippie, J.A. (1951) Phys. Rev. 82, 697.

    Article  Google Scholar 

  11. Klopfer, A. and Schmidt, W. (1960) Vacuum 10, 363.

    Article  Google Scholar 

  12. Charles, D. and Warnecke, R.J. (1959) Vac. Symp. Trans. Amer. Vac. Soc., Pergamon, New York, 34.

    Google Scholar 

  13. Peper, J. (1957–58) Philips Tech. Rev. 19, 218.

    Google Scholar 

  14. Wagener, J.S. and Marth, P.T. (1957) J. Appl. Phys. 28, 1027.

    Article  Google Scholar 

  15. Lawson, R.W. (1962) J. Sci Instrum. 39, 281.

    Article  Google Scholar 

  16. Schluchhardt, G. (1960) Vacuum 10 373.

    Article  Google Scholar 

  17. Brubaker, W.M. and Perkins, G.D. (1956) Rev. Sci. Instrum. 27 720.

    Article  Google Scholar 

  18. Berry, C.E. (1954) J. Appl. Phys. 25 28.

    Article  Google Scholar 

  19. McNarry, L.R. (1958) Can. J. Phys. 36 1710.

    Article  Google Scholar 

  20. Zdanuk, E.J., Bierig, R., Rubin, L.G. and Wolsky, S.P. (1960) Vacuum 10 382.

    Article  Google Scholar 

  21. Stark, D.S. (1959) Vacuum 9 288.

    Article  Google Scholar 

  22. Winkel, T. and Hemmerich, J.L. (1987) J. Vac. Sci. Technol. A5 2637.

    Google Scholar 

  23. Bennett, W.H. (1950) J. Appl. Phys. 21 723.

    Article  Google Scholar 

  24. Kissel, J. (1986) in Todd, J.F.J. ed., Proc. 10th Int. Mass Spectrometry Conf., Swansea,1985, John Wiley, London, 175.

    Google Scholar 

  25. Wiley, W.C. and McLaren, I.H. (1955) Rev. Sci. Instrum., 26 1150.

    Article  Google Scholar 

  26. Walcher, W. (1950) Rev. Sci. Instrum. 21 578

    Google Scholar 

  27. Varadi, P.F. and Sebestyen, L.G. (1956) J. Sci. Instrum. 33 392

    Article  Google Scholar 

  28. Diels, K. and Moesta, H. (1958) Vac. Symp. Trans. Amer. Vac. Soc., Pergamon, New York 115

    Google Scholar 

  29. Wherry, T.C. and Karasek, F.W. (1955) J. Appl. Phys. 26 685

    Article  Google Scholar 

  30. Kendall, B.R.F. (1962) J. Sci. Instrum. 39 267.

    Article  Google Scholar 

  31. Brunnee, C. (1987) Int. J. Mass Spectrom. & Ion Processes 76 125.

    Google Scholar 

  32. Yoshida, Y. (1986) US Patent 4625112.

    Google Scholar 

  33. Rockwood, A.L. (1986) Proc. 34th Ann. Conf. on Mass Spectrometry & Allied Topics, 173.

    Google Scholar 

  34. Breth, A., Dobrozemsky, R. and Kraus, B. (1983) Vacuum 23 73.

    Article  Google Scholar 

  35. Craig, R.D. and Harden, E.H. (1966) Vacuum 16 67.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1989 Blackie & Son Ltd.

About this chapter

Cite this chapter

Leck, J.H. (1989). Gas analysis in vacuum systems: magnetic, crossed-field and time-of-flight analysers. In: Total and Partial Pressure Measurement in Vacuum Systems. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0877-5_6

Download citation

  • DOI: https://doi.org/10.1007/978-1-4613-0877-5_6

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-8224-2

  • Online ISBN: 978-1-4613-0877-5

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics