Abstract
Precise quantitative X-ray analysis often requires an analytical de- scription of the Bragg reflection profile. In the recent papers 1–4 the authors were studying the usefulness of some selected functions, which could have approximated the X-ray diffraction patterns. It seems very important to further analysis which of those functions is the most efficient one. The main question of the present paper is to try to solve this problem.
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References
N. P. Pyros, J.Appl.Cryst. 16: 289 (1983).
E. J. Sonneveld and J. W. Visser, J.Appl.Cryst. 8: 1 (1975).
M. M. Hall, V. G. Veeraraghavan, H. Rubin, and P. G. Winchell, J.Appl. Cryst. 10:66 (1977).
M. Hecq, J.Appl.Cryst. 14: 60 (1981).
R. Delhez and E. J. Mittenmeijer, J.Appl.Cryst. 8: 609 (1975).
F. Pompa and S. Zirilli, J.Appl.Cryst. 15: 602 (1982).
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© 1989 Plenum Press, New York
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Stanisz, G., Holender, J., Sołtys, J. (1989). Bragg Reflection Analysis for Powdered Samples. In: Hašek, J. (eds) X-Ray and Neutron Structure Analysis in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0767-9_49
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DOI: https://doi.org/10.1007/978-1-4613-0767-9_49
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-8072-9
Online ISBN: 978-1-4613-0767-9
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