Abstract
Whenever physicists develop a new machine it seems that chemists try and make an analytical tool out of it, and sometimes with great success. This has also happened with the application of Synchrotron Radiation (S.R.) to X-ray fluorescence analysis. Since the pioneer work of C. Sparks (1,2) at Stanford a little more than ten years ago this technique has been tested in most Synchrotron Radiation centers and we wish to give a general view of the present status in this field. For simplicity we shall refer to this technique as SRXFA (standing for Synchrotron Radiation X-Ray Fluorescence Analysis) although many other abbreviations may be found in the litterature (SYXFA, SRXRF, ...).
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References
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© 1988 Plenum Press, New York
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Chevallier, P. (1988). Synchrotron Radiation Applied to X-Ray Fluorescence Analysis. In: Ferreira, J.G., Ramos, M.T. (eds) X-Ray Spectroscopy in Atomic and Solid State Physics. NATO ASI Series, vol 187. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0731-0_11
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DOI: https://doi.org/10.1007/978-1-4613-0731-0_11
Publisher Name: Springer, Boston, MA
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