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Convergent Beam Electron Diffraction

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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

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Abstract

Experiment 27.1: Setup in STEM Mode. The ray diagram showing CBED formation is given in Figure A27.1 and is compared with SAD formation with a parallel beam of electrons. The CBED is present whether the probe is scanning or stationary. However, the most useful information is obtained in stationary mode.

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References

  1. P. Kelly, A. Jostons, R. Blake, and J. Napier, Physica Status Solidi A31 (1975) 771.

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  2. M. Raghavan et al., Metallurgical Transactions 15A (1984) 1299.

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Authors and Affiliations

  1. Lehigh University, Bethlehem, Pennsylvania, USA

    Charles E. Lyman, Joseph I. Goldstein & David B. Williams

  2. Sandia National Laboratories, Albuquerque, New Mexico, USA

    Alton D. Romig Jr.

  3. University of Cambridge, Cambridge, England

    Patrick Echlin

  4. University of Tennessee, Knoxville, Tennessee, USA

    David C. Joy

  5. National Institute of Standards and Technology, Gaithersburg, Maryland, USA

    Dale E. Newbury & Charles E. Fiori

  6. California Institute of Technology, Pasadena, California, USA

    John T. Armstrong

  7. GE Corporate Research and Development, Schenectady, New York, USA

    Eric Lifshin

  8. The University of Connecticut Health Center, Farmington, Connecticut, USA

    Klaus-Ruediger Peters

Authors
  1. Charles E. Lyman
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  2. Joseph I. Goldstein
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  3. Alton D. Romig Jr.
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  4. Patrick Echlin
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  5. David C. Joy
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  6. Dale E. Newbury
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  7. David B. Williams
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  8. John T. Armstrong
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  9. Charles E. Fiori
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  10. Eric Lifshin
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  11. Klaus-Ruediger Peters
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© 1990 Plenum Press, New York

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Lyman, C.E. et al. (1990). Convergent Beam Electron Diffraction. In: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0635-1_56

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  • DOI: https://doi.org/10.1007/978-1-4613-0635-1_56

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-306-43591-1

  • Online ISBN: 978-1-4613-0635-1

  • eBook Packages: Springer Book Archive

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