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Scanning Transmission Imaging in the AEM

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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

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Abstract

In a TEM/STEM the relationships demonstrated by Experiments 24.1–24.4 can be visualized directly on the TEM screen. In a dedicated STEM these effects can be inferred from effects on the signal profile across a sharp edge and the probe current [1].

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References

  1. J. R. Michael and D. B. Williams, J. Micros. 147 (1987) 289–303.

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Authors and Affiliations

  1. Lehigh University, Bethlehem, Pennsylvania, USA

    Charles E. Lyman, Joseph I. Goldstein & David B. Williams

  2. Sandia National Laboratories, Albuquerque, New Mexico, USA

    Alton D. Romig Jr.

  3. University of Cambridge, Cambridge, England

    Patrick Echlin

  4. University of Tennessee, Knoxville, Tennessee, USA

    David C. Joy

  5. National Institute of Standards and Technology, Gaithersburg, Maryland, USA

    Dale E. Newbury & Charles E. Fiori

  6. California Institute of Technology, Pasadena, California, USA

    John T. Armstrong

  7. GE Corporate Research and Development, Schenectady, New York, USA

    Eric Lifshin

  8. The University of Connecticut Health Center, Farmington, Connecticut, USA

    Klaus-Ruediger Peters

Authors
  1. Charles E. Lyman
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  2. Joseph I. Goldstein
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  3. Alton D. Romig Jr.
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  4. Patrick Echlin
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  5. David C. Joy
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  6. Dale E. Newbury
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  7. David B. Williams
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  8. John T. Armstrong
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  9. Charles E. Fiori
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  10. Eric Lifshin
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  11. Klaus-Ruediger Peters
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© 1990 Plenum Press, New York

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Lyman, C.E. et al. (1990). Scanning Transmission Imaging in the AEM. In: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0635-1_53

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  • DOI: https://doi.org/10.1007/978-1-4613-0635-1_53

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-306-43591-1

  • Online ISBN: 978-1-4613-0635-1

  • eBook Packages: Springer Book Archive

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