Abstract
This laboratory will introduce the basic concepts of stereo microscopy, which comprises the techniques of perceiving and measuring the “third” dimension of rough, topographic specimens. More details and references can be found in SEMXM, Section 4.3.
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References
P. G. T. Howell and A. Boyde, “Comparison of Various Methods for Reducing Measurements from Stereo-Pair Scanning Electron Micrographs to ‘Real 3-D Data,’” Scanning Electron Microscopy, Chicago, IITRI (1972) 233–240.
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© 1990 Plenum Press, New York
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Lyman, C.E. et al. (1990). Stereo Microscopy. In: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0635-1_4
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DOI: https://doi.org/10.1007/978-1-4613-0635-1_4
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-43591-1
Online ISBN: 978-1-4613-0635-1
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