Abstract
With increasing atomic number each x-ray family tends to spread out revealing individual lines that were unresolved for lower-Z elements.
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References
C. E. Fiori and D. E. Newbury, Scanning Electron Microscopy/1978, vol. I, SEM Inc., AMF O’Hare, IL, p. 401.
J. A. Bearden, “X-Ray Wavelengths and X-Ray Atomic Energy Levels,” NSRDS-NBS 14, National Bureau of Standards, Washington (1967). Also published in recent editions of the CRC Handbook of Chemistry and Physics, The Chemical Rubber Company, Cleveland, Ohio.
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© 1990 Plenum Press, New York
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Lyman, C.E. et al. (1990). Energy-Dispersive X-Ray Microanalysis. In: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0635-1_35
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DOI: https://doi.org/10.1007/978-1-4613-0635-1_35
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-43591-1
Online ISBN: 978-1-4613-0635-1
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