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Environmental SEM

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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

Abstract

In this laboratory the new capabilities of environmental SEM will be analyzed and demonstrated. Comparison of BSE and SE imaging under different gas pressures will allow characterization of the various signal components available for imaging of insulators and water. Dynamic imaging of crystallization phenomena will be demonstrated using a cold stage.

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Authors and Affiliations

  1. Lehigh University, Bethlehem, Pennsylvania, USA

    Charles E. Lyman, Joseph I. Goldstein & David B. Williams

  2. Sandia National Laboratories, Albuquerque, New Mexico, USA

    Alton D. Romig Jr.

  3. University of Cambridge, Cambridge, England

    Patrick Echlin

  4. University of Tennessee, Knoxville, Tennessee, USA

    David C. Joy

  5. National Institute of Standards and Technology, Gaithersburg, Maryland, USA

    Dale E. Newbury & Charles E. Fiori

  6. California Institute of Technology, Pasadena, California, USA

    John T. Armstrong

  7. GE Corporate Research and Development, Schenectady, New York, USA

    Eric Lifshin

  8. The University of Connecticut Health Center, Farmington, Connecticut, USA

    Klaus-Ruediger Peters

Authors
  1. Charles E. Lyman
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  2. Joseph I. Goldstein
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  3. Alton D. Romig Jr.
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  4. Patrick Echlin
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  5. David C. Joy
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  6. Dale E. Newbury
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  7. David B. Williams
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  8. John T. Armstrong
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  9. Charles E. Fiori
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  10. Eric Lifshin
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  11. Klaus-Ruediger Peters
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© 1990 Plenum Press, New York

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Lyman, C.E. et al. (1990). Environmental SEM. In: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0635-1_16

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  • DOI: https://doi.org/10.1007/978-1-4613-0635-1_16

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-306-43591-1

  • Online ISBN: 978-1-4613-0635-1

  • eBook Packages: Springer Book Archive

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