Abstract
The purpose of this laboratory is to demonstrate the two types of magnetic contrast, Type I and Type II, which can be detected in suitable specimens in any standard SEM. Because of the special characteristics of the magnetic contrast mechanisms, the steps required to observe magnetic microstructures provide a good illustration of the need to follow an appropriate strategy in order to satisfy the threshold current/contrast relationship and to apply proper signal processing. More detail on this topic may be found in ASEMXM, Chapter 4.
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© 1990 Plenum Press, New York
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Lyman, C.E. et al. (1990). Magnetic Contrast. In: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0635-1_14
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DOI: https://doi.org/10.1007/978-1-4613-0635-1_14
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-43591-1
Online ISBN: 978-1-4613-0635-1
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