Abstract
This laboratory will demonstrate the-contrast produced by the different SE signal components known as SE-I, SE-II, SE-III, and SE-IV. It will also describe methods to measure the proportion of the components and to enhance or suppress certain components. This laboratory is a continuation of Laboratory 11 in which the signal components and contrast mechanisms were described.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1990 Plenum Press, New York
About this chapter
Cite this chapter
Lyman, C.E. et al. (1990). SE Signal Components. In: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0635-1_12
Download citation
DOI: https://doi.org/10.1007/978-1-4613-0635-1_12
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-43591-1
Online ISBN: 978-1-4613-0635-1
eBook Packages: Springer Book Archive