Abstract
In this book we have described a set of analog measurements which may be used to test the quality of a digital IC. Although other tests are possible, and have been proposed, we have described and used a set of tests which are sensitive to degradation of the circuit quality, are convenient to use, give results which can be readily interpreted and have potential for incorporation into an industrial environment using standard equipment.
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© 1990 Plenum Press, New York
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Dorey, A.P., Jones, B.K., Richardson, A.M.D., Xu, Y.Z. (1990). Conclusions. In: Rapid Reliability Assessment of VLSICs. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0587-3_6
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DOI: https://doi.org/10.1007/978-1-4613-0587-3_6
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-7879-5
Online ISBN: 978-1-4613-0587-3
eBook Packages: Springer Book Archive