Abstract
As part of the general investigation of rapid reliability assessment the devices being studied experimentally were also simulated using a standard circuit simulation package, PSPICE (Microsim Corporation), which i3 a version written for use on the IBM personal computer. The simulations gave the size and shape of the waveforms occuring in the circuits being studied and the effect of different conditions within the circuit on these waveforms.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Reference
Syrzycki, M., 1987, Proc. 1987 Int. Test Conf., IEEE, 148–57.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1990 Plenum Press, New York
About this chapter
Cite this chapter
Dorey, A.P., Jones, B.K., Richardson, A.M.D., Xu, Y.Z. (1990). The Devices Studied and their Simulation. In: Rapid Reliability Assessment of VLSICs. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0587-3_2
Download citation
DOI: https://doi.org/10.1007/978-1-4613-0587-3_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-7879-5
Online ISBN: 978-1-4613-0587-3
eBook Packages: Springer Book Archive