Abstract
Digital, very large scale integrated circuits (VLSICs) are used widely. In many applications the incorrect function of the circuit upon installation, or the malfunction or failure during use, are inconveniences which are often detected during the early operation or burn-in period of the system in which the circuit is used. However, in some applications where the replacement cost is high or the consequences of failure are serious, highly reliable devices of high quality are needed. Examples of such uses are in satellites, undersea cable, remote stations, manned space vehicles and for military systems.
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© 1990 Plenum Press, New York
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Dorey, A.P., Jones, B.K., Richardson, A.M.D., Xu, Y.Z. (1990). Introduction to VLSI Testing. In: Rapid Reliability Assessment of VLSICs. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0587-3_1
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DOI: https://doi.org/10.1007/978-1-4613-0587-3_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-7879-5
Online ISBN: 978-1-4613-0587-3
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