Scanning electron micrographs prepared with the backscattered- electron signal provide direct information on compositional heterogeneity through the mechanism of atomic number contrast. Such images are quite useful for characterizing microstructures, but the compositional information that they contain is nonspecific. That is, while the sequence of the average atomic numbers of the phases present can be recognized and classified by the relative gray levels in the image, that image conveys no specific information to identify the elements present or the concentration levels.
KeywordsCount Rate Background Correction Average Atomic Number Atomic Number Contrast Compositional Contrast
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