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Compositional Imaging

  • Joseph I. Goldstein
  • Dale E. Newbury
  • Patrick Echlin
  • David C. Joy
  • A. D. RomigJr.
  • Charles E. Lyman
  • Charles Fiori
  • Eric Lifshin

Abstract

Scanning electron micrographs prepared with the backscattered- electron signal provide direct information on compositional heterogeneity through the mechanism of atomic number contrast. Such images are quite useful for characterizing microstructures, but the compositional information that they contain is nonspecific. That is, while the sequence of the average atomic numbers of the phases present can be recognized and classified by the relative gray levels in the image, that image conveys no specific information to identify the elements present or the concentration levels.

Keywords

Count Rate Background Correction Average Atomic Number Atomic Number Contrast Compositional Contrast 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1992

Authors and Affiliations

  • Joseph I. Goldstein
    • 1
  • Dale E. Newbury
    • 2
  • Patrick Echlin
    • 3
  • David C. Joy
    • 4
  • A. D. RomigJr.
    • 5
  • Charles E. Lyman
    • 1
  • Charles Fiori
    • 2
  • Eric Lifshin
    • 6
  1. 1.Lehigh UniversityBethlehemUSA
  2. 2.National Institute of Standards and TechnologyGaithersburgUSA
  3. 3.University of CambridgeCambridgeEngland
  4. 4.University of TennesseeKnoxvilleUSA
  5. 5.Sandia National LaboratoriesAlbuquerqueUSA
  6. 6.General Electric Corporate Research and DevelopmentSchenectadyUSA

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