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Hot-Carrier Noise under Degenerate Conditions

  • Patrick Tadyszak
  • Alain Cappy
  • Francois Danneville
  • Lino Reggiani
  • Luca Varani
  • Lucio Rota

Abstract

Degeneracy plays an important role in most electronic devices when regions with high carrier concentration exist and/or low temperatures are considered. After the seminal paper of Bosi and Jacoboni1, several authors2–4 have investigated degeneracy effects by using the Monte Carlo (MC) technique. While most of the interest has been addressed to study average quantities, to our knowledge electronic noise has never been considered. Therefore, it is the aim of this paper to analyze some interesting effects associated with the many-body character of degeneracy on noise in the presence of an external electric field of arbitrary strength. As interesting feature, we remind that because of degeneracy no simple relation (e.g. Price’s relationship5) exists between noise and diffusion. Thus, modeling of noise under degenerate conditions cannot relate on the knowledge of diffusion, and its determination rests on the calculation of the correspondent current (or voltage) correlation function.

Keywords

Monte Carlo Drift Velocity External Electric Field Degenerate Condition Fermi Sphere 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    S. Bosi and C. Jacoboni, J. Phys. C: Solid-State Phys. 9, 315 (1976).ADSCrossRefGoogle Scholar
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    P. Lugli and D.K. Ferry, IEEE Trans. Electron Dev., ED-32, 2431 (1985).Google Scholar
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    M.V. Fischetti and S.E. Laux, Phys. Rev B38, 9721 (1988).ADSGoogle Scholar
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    N.S. Mansour, K. Diff and K.F. Brennan, J. Appl. Phys. 70, 6854 (1991).ADSCrossRefGoogle Scholar
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    P.J. Price: in “Fluctuation Phenomena in Solids”, Ed. by R.E. Burgess (Academic Press, New York, 1965 ) p. 355.Google Scholar
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    L. Varani and L. Reggiani, Rivista Nuovo Cimento 17, 1 (1994).CrossRefGoogle Scholar
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    L. Varani, Proc. 13th Int Conf. on Noise in Physical Systems and 1/f Fluctuations, Eds. V. Bareikis and R. Katilius, World Scientific (Singapore, 1995) p. 203.Google Scholar

Copyright information

© Plenum Press, New York 1996

Authors and Affiliations

  • Patrick Tadyszak
    • 1
  • Alain Cappy
    • 1
  • Francois Danneville
    • 1
  • Lino Reggiani
    • 2
  • Luca Varani
    • 3
  • Lucio Rota
    • 4
  1. 1.Institut d’Electronique et de Microelectronique du Nord U.M.R. CNRS n. 9929, Departement Hyperfrequences et SemiconducteursDomain Scientifique et Universitaire de Villeneuve D’ AscqVilleneuve D’Ascq CedexFrance
  2. 2.Istituto Nazionale di Fisica della Materia, Dipartimento di Scienza dei MaterialiUniversità di LecceLecceItaly
  3. 3.Centre d’Electronique de MontpellierU.R.A. CNRS n. 391 Université Montpellier IIMontpellier Cedex 5France
  4. 4.Clarendon Laboratory, Department of PhysicsUniversity of OxfordOxfordUK

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