Automation of Data Analysis Programs Used in the Cryogenic Characterization of Superconducting Microwave Resonators

Abstract

Knowledge of the microwave properties at cryogenic temperatures of components fabricated using High-Temperature-Superconductors (HTS) is useful in the design of HTS-based microwave circuits. Therefore, fast and reliable characterization techniques have been developed to study the aforementioned properties. In this paper, we discuss computer analysis techniques employed in the cryogenic characterization of HTS-based resonators. The revised data analysis process requires minimal user input, and organizes the data in a form that is easily accessible by the user for further examination. These programs retrieve data generated during the cryogenic characterization at microwave frequencies of HTS based resonators and use it to calculate parameters such as the loaded and unloaded quality factors (Q and Q₀, respectively), the resonant frequency (f₀), and the coupling coefficient (κ), which are important quantities in the evaluation of HTS resonators. While the data are also stored for further use, the programs allow the user to obtain a graphical representation of any of the measured parameters as a function of temperature soon after the completion of the cryogenic measurement cycle. Although these programs were developed to study planar HTS-based resonators operating in the reflection mode, they could also be used in the cryogenic characterization of two ports (i.e., reflection/transmission) resonators.