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Trends in Industrial and Applied Mathematics pp 63–76Cite as

The ‘Riesz Basis Method’ for Deriving Sampling Series: An Overview and Some Applications

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Part of the book series: Applied Optimization ((APOP,volume 72))

Abstract

A method for finding Riesz sampling bases for classes of band-limited functions is reviewed. Its connections with stability of sampling, and with sample point density are described. Some examples involving derivatives and Riesz transforms illustrate various aspects of the method.

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References

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Author information

Authors and Affiliations

  1. I.H.P, 4 Rue du Bary, 11250, Montclar, France

    J. R. Higgins

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  1. J. R. Higgins
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Editor information

Editors and Affiliations

  1. Department of Mathematical Sciences, King Fand University of Petroleum and Minerals, Dhahran, Saudi Arabia

    Abul Hasan Siddiqi

  2. Institute of Applied Mathematics, University of Erlangen, Erlangen, Germany

    Michal Kočvara

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© 2002 Kluwer Academic Publishers

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Higgins, J.R. (2002). The ‘Riesz Basis Method’ for Deriving Sampling Series: An Overview and Some Applications. In: Siddiqi, A.H., Kočvara, M. (eds) Trends in Industrial and Applied Mathematics. Applied Optimization, vol 72. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0263-6_3

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  • DOI: https://doi.org/10.1007/978-1-4613-0263-6_3

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-7967-6

  • Online ISBN: 978-1-4613-0263-6

  • eBook Packages: Springer Book Archive

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