Summary
The maximum forward- and reverse-voltage-blocking capability of power thyristors are dependent on the small-signal current gains of the p-n-p and n-p-n transistor sections, on the junction type, and on silicon resistivity.
For small values of current gains, the maximum forward- and reverse-blocking potentials are equal. In the shorted cathode emitter case, both the maximum forward breakover point and maximum reverse-blocking voltage are determined by the condition, α1 = 1/M, which states that the breakdown occurs when the small-signal common base current gain of the idealized symmetrical p-n-p thyristor section is equal to the reciprocal of the avalanche-multiplication factor M. This relationship permits the approximate computation of the maximum blocking capability since the multiplication factor and current gain are known voltage functions.
Improved breakover and/or other characteristics can be obtained in the reverse conducting thyristor (RCT) in which both the cathode and anode emitters have shorted regions.
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References
A. Herlet. The maximum blocking capability of silicon thyristors. Solid State Electronics, 8: 655–671, 1968.
J. L. Moll, J. L. Su, and A. C. M. Wang. Multiplication in collector junctions of silicon n-p-n and p-n-p transistors. IEEE Trans. Electron Devices, ED-17 (5): 420–423, 1970.
S. M. Sze and G. Gibbons. Avalanche breakdown voltages of abrupt and linearly graded p-n junctions in Ge, Si, GaAs, GaP. Appl. Phys. Lett., 8: 111, 1966.
J. Olmstead. RCA, Solid State Technology Center, Somerville, N.J., private communication, 1970.
P. Kannam. RCA, Solid State Technology Center, Somerville, N.J., private communication, 1973.
H. Lawrence and R. M. Werner, Jr. Diffused junction depletion layer calculations. Monograph 3517, Bell Telephone System Technical Publications, and BSTJ, 39: 389–404, 1960.
C. R. Crowell and S. M. Sze. Temperature dependence of avalanche multiplication on semiconductors. Appl Phys. Lett., 9: 242–244, 1966.
R. Davies and F. Gentry. Control of electric fields at the surface of p-n junctions. IEEE Trans. Electron Devices, ED-11: 313–323, 1964.
Jozef Cornu. Field distribution near the surface of beveled p-n junctions in high-voltage devices. Trans. Electron Devices, ED-20 (7): 347–352, 1973.
R. A. Kokosa and B. R. Tuft. A high voltage, high temperature reverse conducting thyristor. IEEE Trans. Electron Devices, ED-17 (9): 667–672, 1970.
L. S. Greenberg, and E. F. McKeon. ITR—A new reverse conducting thyristor for horizontal deflection. 22nd Electronic Components Conference, Washington, D.C., May 1972.
T. Matsuzawa and Y. Usunaga. Some electrical characteristics of a reverse conducting thyristor. IEEE Trans. Electron Devices, ED-17 (9): 816, 1970.
J. L. Moll. Physics of Semiconductors. New York: McGraw-Hill, 1964.
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© 1976 Springer-Verlag New York Inc.
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Blicher, A. (1976). Thyristor maximum voltage-blocking capability. In: Thyristor Physics. Applied Physics and Engineering, vol 12. Springer, New York, NY. https://doi.org/10.1007/978-1-4612-9877-9_3
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DOI: https://doi.org/10.1007/978-1-4612-9877-9_3
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