Abstract
We examine the performance of the standard tests—the mean test, the t-test, the Wilcoxon test and the sign test—for testing that the measure of central tendency of a distribution is zero. We do this by comparing the Bahadur slopes in a contaminated normal model. We first establish the large deviation principle (LDP) and then calculate the Bahadur slopes for the standard test statistics when the observations come from a contaminated normal distribution. An examination of tables of Bahadur efficiencies reveals that the Wilcoxon test outperforms other tests in a neighborhood of the null hypothesis, even in the presence of moderate contamination, but not uniformly over the whole alternative hypothesis.
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References
Andrews, D. F., Bickel, P. J., Hampel, F. R., Huber, P. J., Rogers, W. H. and Tukey, J. W. (1972). Robust Estimates of Location: Survey and Advances, Princeton: Princeton University Press.
Bahadur, R. R. (1960). Stochastic comparison of tests, Annals of Mathematical Statistics, 31, 276–295.
Bahadur, R. R. (1967). Rates of convergence of estimates and test statistics, Annals of Mathematical Statistics, 38, 303–324.
Bahadur, R. R. (1971). Some Limit Theorems in Statistics, CBMS/NSF Regional Conference in Applied Mathematics-4, Philadelphia: SIAM.
Chaganty N. R. (1997). Large deviations for joint distributions and statistical applications, Sankhyā, Series A (to appear).
Chaganty, N. R. and Sethuraman, J. (1997). Bahadur slope of the t-statistic for a contaminated normal, Statistics & Probability Letters (to appear).
DasGupta, A. (1994). Bounds on asymptotic relative efficiencies of robust estimates of locations for random contaminations, Journal of Statistical Planning and Inference, 41, 73–93.
Ellis, R. S. (1984). Large deviations for a general class of random vectors, Annals of Probability, 12, 1–12.
Hodges, J. L., Jr. and Lehmann, E. L. (1956). The efficiency of some nonparametric competitors of the t-test, Annals of Mathematical Statistics, 27, 324–335.
Hodges, J. L., Jr. and Lehmann, E. L. (1961). Comparison of the normal scores and Wilcoxon tests, Proceedings of the 4th Berkeley Symposium on Mathematical Statistics and Probability, 1, 307–317.
Hoeffding, W. (1953). On the distribution of the expected values of the order statistics, Annals of Mathematical Statistics, 24, 93–100.
Huber, P. J. (1981). Robust Statistics, New York: John Wiley & Sons.
Klotz, J. (1965). Alternative efficiencies for the signed rank tests, Annals of Mathematical Statistics, 36, 1759–1766.
Lehmann, E. L. (1983). Theory of Point Estimation, New York: John Wiley & Sons.
Lynch, J. and Sethuraman, J. (1987). Large deviations for processes with independent increments, Annals of Probability, 15, 610–627.
Serfling, R. J. (1980). Approximation Theorems of Mathematical Statistics, New York: John Wiley & Sons.
Staudte, R. G., Jr. (1980). Robust estimation, Queen’s Papers in Pure and Applied Mathematics, No. 53, Queen’s University, Kingston, Ontario.
Tiku, M. L., Tan, W. Y. and Balakrishnan, N. (1986). Robust Inference, New York: Marcel Dekker.
Tukey, J. W. (1960). A survey of sampling from contaminated distributions, In Contributions to Probability and Statistics (Ed., I. Olkin), Stanford, CA: Stanford University Press.
Varadhan, S. R. S. (1984). Large Deviations and Applications, CBMS/NSF Regional Conference in Applied Mathematics-46, Philadelphia: SIAM.
Wieand, H. S. (1976). A condition under which the Pitman and Bahadur approaches to efficiency coincide, Annals of Statistics, 4, 1003–1011.
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© 1997 Birkhäuser Boston
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Chaganty, N.R., Sethuraman, J. (1997). The Large Deviation Principle for Common Statistical Tests Against a Contaminated Normal. In: Panchapakesan, S., Balakrishnan, N. (eds) Advances in Statistical Decision Theory and Applications. Statistics for Industry and Technology. Birkhäuser Boston. https://doi.org/10.1007/978-1-4612-2308-5_16
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DOI: https://doi.org/10.1007/978-1-4612-2308-5_16
Publisher Name: Birkhäuser Boston
Print ISBN: 978-1-4612-7495-7
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