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A Start-Up Demonstration Test Using a Simple Scan-Based Statistic

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Scan Statistics and Applications

Part of the book series: Statistics for Industry and Technology ((SIT))

Abstract

Recently, start-up demonstration tests and various extensions of them (in order to accommodate dependence between the trials, to allow for corrective action to be taken once the equipment fails for the first time, etc.) have been discussed in the literature. In this chapter, we propose a start-up demonstration test using a simple scan-based statistic that would facilitate an early rejection of a potentially bad equipment. We then derive the probability generating function of the waiting time for rejection of an equipment and the mean and variance of the waiting time. We also present some recurrence relations satisfied by the probability mass function and the moments. In addition, we indicate how the moment estimator for the unknown probability of success(p)of the individual trials can be derived. The case of start-up demonstration testing when consecutive attempts are dependent in a Markovian fashion is discussed next. Finally, we present a numerical example to illustrate the test proposed and the usefulness of the results established in this chapter.

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References

  1. Aki, S., Balakrishnan, N. and Mohanty, S. G. (1996). Sooner and later waiting time problems for success and failure runs in higher order Markov dependent trialsAnnals of the Institute of Statistical Mathematics 48773–787.

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© 1999 Springer Science+Business Media New York

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Koutras, M.V., Balakrishnan, N. (1999). A Start-Up Demonstration Test Using a Simple Scan-Based Statistic. In: Glaz, J., Balakrishnan, N. (eds) Scan Statistics and Applications. Statistics for Industry and Technology. Birkhäuser, Boston, MA. https://doi.org/10.1007/978-1-4612-1578-3_11

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  • DOI: https://doi.org/10.1007/978-1-4612-1578-3_11

  • Publisher Name: Birkhäuser, Boston, MA

  • Print ISBN: 978-1-4612-7201-4

  • Online ISBN: 978-1-4612-1578-3

  • eBook Packages: Springer Book Archive

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