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Informatics and Management Science III pp 179–185Cite as

Huang Diffuse Scattering from Small Planar Dislocation Loops

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Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 206))

Abstract

This paper gives out a theoretical framework of electron/X-ray Huang diffuse scattering intensity at the immediate vicinity of Bragg reflection in reciprocal space. Nodal lines of two types in the simulated patterns of Huang diffuse scattering intensity are discussed in connection with a loop shape factor and the Huang diffuse scattering intensity from infinitesimal loops. It is suggested that the Huang diffuse scattering method is supplementary to the conventional TEM amplitude contrast imaging techniques and it has advantages in characterizing the morphology of very small dislocation loop when other methods fail.

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Author information

Authors and Affiliations

  1. Key Laboratory for Material Microstructures, Shanghai University, 200444, Shanghai, China

    Zhongfu Zhou

  2. Department of Materials, University of Oxford, Oxford, OX1 3PH, UK

    Zhongfu Zhou

  3. Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth, SY23 3BZ, UK

    Zhongfu Zhou

  4. Key Laboratory for Material Microstructures, Shanghai University, 200444, Shanghai, China

    Yaru Zhang

  5. Department of Physics, Imperial College, Exhibition Road, London, SW7 2AZ, UK

    Adrian P. Sutton

  6. Culham Centre for Fusion Energy, Oxfordshire, OX14 3DB, UK

    Sergei L. Dudarev

  7. Department of Materials, University of Oxford, Oxford, OX1 3PH, UK

    Michael L. Jenkins

  8. Materials Science Division, Argonne National Laboratory, Argonne, IL, 60439, USA

    Mark A. Kirk

  9. Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth, SY23 3BZ, UK

    George N. Greaves

  10. State Key Laboratory for Mesoscopic Physics and Department of Physics, Peking, China

    Lixin Xiao

Authors
  1. Zhongfu Zhou
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  2. Yaru Zhang
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  3. Adrian P. Sutton
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  4. Sergei L. Dudarev
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  5. Michael L. Jenkins
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  6. Mark A. Kirk
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  7. George N. Greaves
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  8. Lixin Xiao
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Corresponding author

Correspondence to Zhongfu Zhou .

Editor information

Editors and Affiliations

  1. College of Elementary Education, Chongqing Normal University, Chongqing, China, People's Republic

    Wenjiang Du

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© 2013 Springer-Verlag London

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Cite this paper

Zhou, Z. et al. (2013). Huang Diffuse Scattering from Small Planar Dislocation Loops. In: Du, W. (eds) Informatics and Management Science III. Lecture Notes in Electrical Engineering, vol 206. Springer, London. https://doi.org/10.1007/978-1-4471-4790-9_24

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  • DOI: https://doi.org/10.1007/978-1-4471-4790-9_24

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  • Publisher Name: Springer, London

  • Print ISBN: 978-1-4471-4789-3

  • Online ISBN: 978-1-4471-4790-9

  • eBook Packages: EngineeringEngineering (R0)

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