Abstract
What was said about the advantages to be gained in visual recognition of surfaces for three as opposed to two dimensions is equally the case for surface microscopy. Here, the optical definition is significantly greater and so will be the depth of field in focus, particularly for imaging with scanning electron microscopes. Measurements taken on the surface and particularly those for two-dimensional surface topographical characterisation are quantitative in nature. In the case of three-dimensional imaging, if this is compared to the surface geometry information obtained from two-dimensional surfaces, then the surface characterisation data in the main will tend to be possibly more qualitative. Therefore, any attempt at comparisons between the different systems becomes somewhat superfluous and, at best, would be misleading.
“With affection beaming out of one eye, and calculation shining out of the other.”
(Martin Chuzzlewit, Charles Dickens, 1812–1870)
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© 2002 Springer-Verlag London
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Smith, G.T. (2002). Surface microscopy. In: Industrial Metrology. Springer, London. https://doi.org/10.1007/978-1-4471-3814-3_3
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DOI: https://doi.org/10.1007/978-1-4471-3814-3_3
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