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A New Method for Line Matching

  • Conference paper
Information Engineering and Applications

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 154))

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Abstract

To exploit the existing mature technology of points matching and combine the concept of edge potential functions (EPF), proposing a new method to match curve segments. The method makes full of feature points, the relation between feature points and curves, and gray space, has matching accuracy, and narrows down the searching space and improves the speed of matching.

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References

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Acknowledgements

This work is sponsored by Project No10XLB19 supported by Dr. Research Funds of Chongqing Normal University, Chongqing Education Committee (KJ090809) and Chongqing Higher Education Educational Reform (NO:102118).

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Authors and Affiliations

  1. College of Computer and Information Science, Chongqing Normal University, Chongqing, 400047, China

    Yanxia Wang & Ma Yan

  2. Department education administration, Guizhou University of Finance and Economics, Guiyang, 550004, China

    Qixin Chen

Authors
  1. Yanxia Wang
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  2. Ma Yan
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  3. Qixin Chen
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Corresponding author

Correspondence to Yanxia Wang .

Editor information

Editors and Affiliations

  1. South-Central University for Nationaliti, Wuhan, 430074, China, People's Republic

    Rongbo Zhu

  2. , School of Computer and Information, Chongqing Normal University, Chongqing, 401331, China, People's Republic

    Yan Ma

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© 2012 Springer-Verlag London Limited

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Wang, Y., Yan, M., Chen, Q. (2012). A New Method for Line Matching. In: Zhu, R., Ma, Y. (eds) Information Engineering and Applications. Lecture Notes in Electrical Engineering, vol 154. Springer, London. https://doi.org/10.1007/978-1-4471-2386-6_210

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  • DOI: https://doi.org/10.1007/978-1-4471-2386-6_210

  • Publisher Name: Springer, London

  • Print ISBN: 978-1-4471-2385-9

  • Online ISBN: 978-1-4471-2386-6

  • eBook Packages: EngineeringEngineering (R0)

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