This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
Cappy A. et al (1985) Noise modeling in submicrometer gate two dimensional electron-gas field effect transistor. IEEE Trans. Electron Devices 32, n° 12: 2787–2795.
Cappy A., Heinrich W. (1989). The high frequency FET noise performance: A new approach. IEEE Trans. Electron Devices 36, n° 1.
Cappy A. (1988). Noise modelling and measurement techniques. IEEE Trans. MTT 36, n° 1: 1–10.
Carnez B. et al (1981). Noise modelling in submicrometer gate FET’s. IEEE Trans. Electron Devices, Vol. 28, n° 7: 784–789.
Edson W.A. (1960). Noise in oscillators. Proc. IRE, Vol. 48: 1454–1466.
Kurokawa K. (1968). Noise in synchronized oscillators. IEEE Trans. MTT, Vol. 16, n° 4: 234–240.
Moglestue C. (1985). A Monte Carlo particle study of the intrinsic noise figure in GaAs MESFET’s. IEEE Trans. Electron Devices, Vol. ED-32, n° 10: 2092–2096.
Nougier J.P. et al (1985). Numerical modelling of the noise of one dimensional devices. Physica B 134: 260–263.
Nougier J.P. (1987). Bruit dans les composants. Rev. de Physique Appliquée 22.
Nougier J.P. et al (1983). Microscopic spatial correlations at thermal equilibrium in non polar semiconductors. In noise in Physical systems, Elsevier Science Publishers: 15–18.
Pucel R.A. et al (1974). Signal and noise properties of gallium arsenide field effect transistors advances in electronics and Electron physics, Vol. 38: 195–265.
Rothe H. and Dahlke W. (1956). Theory of noisy fourpoles. Proc. IRE, Vol. 44: 811–818.
Shockley W. et al (1966) in quantum theory of atoms, Molecules and the solid state ( Academic, New York ): 537.
Van der Ziel A. (1954). Noise, Prentice Hall, Englewood Cliffs, N.J.
Van der Ziel A. (1962). Thermal noise in field effect transistor. Proc. IRE, Vol. 50: 1808–1812.
Van der Ziel A. (1988). Unified presentation of 1/f noise in electronic devices: fundamental 1/f noise source. Proc. of the IEEE, vol. 76, n° 3: 233–258.
Van Vliet K.M. et al (1975). Noise in single injection diodes: I a sinvey of methods. JAP, Vol. 46, n° 4, 1804–1813.
Van Vliet K.M. (1979). The transfer-impedance method for noise in field-effect transistors. Solid-state electronics, Vol. 22: 233–236.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1989 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Cappy, A. (1989). Modelling of Noise Processes. In: Snowden, C.M. (eds) Semiconductor Device Modelling. Springer, London. https://doi.org/10.1007/978-1-4471-1033-0_11
Download citation
DOI: https://doi.org/10.1007/978-1-4471-1033-0_11
Publisher Name: Springer, London
Print ISBN: 978-1-4471-1259-4
Online ISBN: 978-1-4471-1033-0
eBook Packages: Springer Book Archive