Abstract
This chapter gives the basic information about circuits and testing of circuits. The role of Automatic Test Pattern Generation (ATPG) in the production test is presented in Sect. 2.1. Section 2.2 gives information about the used abstraction level of circuits and shows the modeling as well as the basic notations for the circuit representation used. In Sect. 2.3, the meaning of a fault model is described and relevant fault models are introduced, while classical algorithms for test pattern generation for these fault models are presented in Sect. 2.4. Section 2.5 briefly reviews the industrial test environment.
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© 2012 Springer Science+Business Media, LLC
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Eggersglüß, S., Drechsler, R. (2012). Circuits and Testing. In: High Quality Test Pattern Generation and Boolean Satisfiability. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-9976-4_2
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DOI: https://doi.org/10.1007/978-1-4419-9976-4_2
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Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-9975-7
Online ISBN: 978-1-4419-9976-4
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