Abstract
The implementation of self-test, as discussed in this book, is not geared exclusively for production testing but also for post-production. Post-production, or more specifically, post-deployment testing will provide the platform for the implementation of on-chip adaptive calibration. The goal then is not to pass production testing only but to ensure that a product does not operate at the edges of the pass zone, but always comfortably in its optimal region. This is not only to satisfy silicon yield but also to ease the ever increasing complexity of the design process.
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Bou-Sleiman, S., Ismail, M. (2012). Efficient Testing for RF SoCs. In: Built-in-Self-Test and Digital Self-Calibration for RF SoCs. SpringerBriefs in Electrical and Computer Engineering(). Springer, New York, NY. https://doi.org/10.1007/978-1-4419-9548-3_3
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