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Influence of Transients on Breakdown Probability of Fixed Defects in SF6

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Gaseous Dielectrics X

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Abstract

SF6 gas has nowadays established itself as a reliable insulating medium for gas-insulated switchgear (GIS). In GIS however different kind of defects may occur, such as protrusions fixed to the conductors. Such defects locally enhance the electric field, which can result in partial discharge (PD) activity or even breakdown.

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References

  1. F.H. Kreuger, Industrial High Voltage, Vol. 2, Delft University Press, 1991.

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  2. B.F. Hampton, R.J. Meats, Diagnostic measurements at UHF in gas insulated substations, IEE Proceedings, Vol. 135, Pt. C, No. 2, pp. 137–144, 1988.

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  3. M. Albiez, Partial Discharge measurements on SF6 insulated switchgear, PhD Thesis, 1992 (In German)

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  4. K. Feser, R. Kurrer, Insulation Monitoring of Gas-Insulated Substations with Respect to Life Cycle, Tutorial In-Service Diagnostics of High Voltage Power Apparatus, ISH 1997.

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Author information

Authors and Affiliations

  1. Delft University of Technology, High Voltage Technology and Management, Delft, The Netherlands

    Sander Meijer, Robert G. A. Zoetmulder, Paul V. M. van Nes & Johan J. Smit

Authors
  1. Sander Meijer
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  2. Robert G. A. Zoetmulder
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  3. Paul V. M. van Nes
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  4. Johan J. Smit
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Editor information

Editors and Affiliations

  1. Academy of Athens, Athens, Greece

    Loucas G. Christophorou

  2. National Institute of Standards and Technology, Gaithersburg, Maryland, USA

    James K. Olthoff

  3. National Technical University of Athens, Athens, Greece

    Panayota Vassiliou

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© 2004 Springer Science+Business Media New York

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Meijer, S., Zoetmulder, R.G.A., van Nes, P.V.M., Smit, J.J. (2004). Influence of Transients on Breakdown Probability of Fixed Defects in SF6 . In: Christophorou, L.G., Olthoff, J.K., Vassiliou, P. (eds) Gaseous Dielectrics X. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-8979-6_36

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  • DOI: https://doi.org/10.1007/978-1-4419-8979-6_36

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-4745-3

  • Online ISBN: 978-1-4419-8979-6

  • eBook Packages: Springer Book Archive

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