Abstract
As discussed in the previous chapter, small-delay defects (SDDs) introduce a small amount of extra delay to the design, and it is commonly recommended to detect SDDs via long paths running through fault sites [3, 4, 5, 6, 7, 8, 9, 10]. Therefore, if a pattern sensitizes a large number of long paths, it can detect all the SDDs along these long paths, and can be considered as an effective pattern. That is the basis of the book.
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Tehranipoor, M., Peng, K., Chakrabarty, K. (2011). Long Path-Based Hybrid Method. In: Test and Diagnosis for Small-Delay Defects. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-8297-1_3
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DOI: https://doi.org/10.1007/978-1-4419-8297-1_3
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