Long Path-Based Hybrid Method

  • Mohammad Tehranipoor
  • Ke Peng
  • Krishnendu Chakrabarty


As discussed in the previous chapter, small-delay defects (SDDs) introduce a small amount of extra delay to the design, and it is commonly recommended to detect SDDs via long paths running through fault sites [3, 4, 5, 6, 7, 8, 9, 10]. Therefore, if a pattern sensitizes a large number of long paths, it can detect all the SDDs along these long paths, and can be considered as an effective pattern. That is the basis of the book.


Pattern Selection Clock Period Critical Fault Automatic Test Pattern Generation Pattern Grade 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  • Mohammad Tehranipoor
    • 1
  • Ke Peng
    • 2
  • Krishnendu Chakrabarty
    • 3
  1. 1.ECE DepartmentUniversity of ConnecticutStorrsUSA
  2. 2.Freescale SemiconductorMicrocontroller Solutions GroupAustinUSA
  3. 3.ECE DepartmentDuke UniversityDurhamUSA

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