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Nanoscale Reference Materials

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Nanotechnology Standards

Part of the book series: Nanostructure Science and Technology ((NST))

Abstract

Globalisation of both science and trade has increased the relevance of the ­comparability of measurement data whether in research, industry or regulatory contexts. Reference materials (RMs) are essential tools in the quest for comparable and reliable measurement results, a quest which laboratories, worldwide, are tasked with every day. An explicit acknowledgement of the importance of RMs in today’s measurement systems is found, for instance, in the laboratory accreditation standards, such as ISO/IEC 17025 [1].

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Author information

Authors and Affiliations

  1. Joint Research Centre of the European Commission, Institute for Reference Materials and Measurements, Geel, Belgium

    Gert Roebben

Authors
  1. Gert Roebben
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  2. Hendrik Emons
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  3. Georg Reiners
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Corresponding author

Correspondence to Gert Roebben .

Editor information

Editors and Affiliations

  1. NIOSH, E. Street SW., 395, Washington, 20201, District of Columbia, USA

    Vladimir Murashov

  2. NIOSH, E. Street SW., 395, Washington, 20201, District of Columbia, USA

    John Howard

Glossary

AES

Auger electron spectrometry

AFM

Atomic force microscope

BAM

Bundesanstalt für Materialforschung und –prüfung

BET

Brunauer-Emmett-Teller (inventors of the BET technique for surface area measurements)

CNT

Carbon nanotube

CRM

Certified reference material

ERM

European Reference Materials

ESCA

Electron spectroscopy chemical analysis

IEC

International Electrotechnical Commission

ILC

Interlaboratory comparison

IRMM

Institute for Reference Materials and Measurements

ISO

International Organization for Standardization

ISO/REMCO

The ISO Committee on Reference Materials

JRC

Joint Research Centre of the European Commission

NIST

National Institute for Standards and Technology (USA)

NMI

National Metrology Institute

NMIJ

National Metrology Institute of Japan

PS

Polystyrene

RM

Reference material

SAXS

Small-angle x-ray scattering

SEM

Scanning electron microscope

SI

International System of Units

SIMS

Secondary ion mass spectrometry

SPM

Scanning probe microscope

SWCNT

Single wall carbon nanotube

TC

Technical Committee

TEM

Transmission electron microscope

TS

Technical Specification

USA

United States of America

VIM

International Vocabulary of Metrology

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Roebben, G., Emons, H., Reiners, G. (2011). Nanoscale Reference Materials. In: Murashov, V., Howard, J. (eds) Nanotechnology Standards. Nanostructure Science and Technology. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7853-0_3

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