Nanoscale Reference Materials

  • Gert Roebben
  • Hendrik Emons
  • Georg Reiners
Part of the Nanostructure Science and Technology book series (NST)


Globalisation of both science and trade has increased the relevance of the ­comparability of measurement data whether in research, industry or regulatory contexts. Reference materials (RMs) are essential tools in the quest for comparable and reliable measurement results, a quest which laboratories, worldwide, are tasked with every day. An explicit acknowledgement of the importance of RMs in today’s measurement systems is found, for instance, in the laboratory accreditation standards, such as ISO/IEC 17025 [1].


Reference Material Certify Reference Material Interlaboratory Comparison Metrological Traceability Relative Expanded Uncertainty 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.




Auger electron spectrometry


Atomic force microscope


Bundesanstalt für Materialforschung und –prüfung


Brunauer-Emmett-Teller (inventors of the BET technique for surface area measurements)


Carbon nanotube


Certified reference material


European Reference Materials


Electron spectroscopy chemical analysis


International Electrotechnical Commission


Interlaboratory comparison


Institute for Reference Materials and Measurements


International Organization for Standardization


The ISO Committee on Reference Materials


Joint Research Centre of the European Commission


National Institute for Standards and Technology (USA)


National Metrology Institute


National Metrology Institute of Japan




Reference material


Small-angle x-ray scattering


Scanning electron microscope


International System of Units


Secondary ion mass spectrometry


Scanning probe microscope


Single wall carbon nanotube


Technical Committee


Transmission electron microscope


Technical Specification


United States of America


International Vocabulary of Metrology


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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Joint Research Centre of the European CommissionInstitute for Reference Materials and MeasurementsGeelBelgium

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