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Characterization Methodologies of Thermal Management Materials

  • Xingcun Colin Tong
Chapter
Part of the Springer Series in Advanced Microelectronics book series (MICROELECTR., volume 30)

Abstract

The materials selection for thermal management of electronic packaging is influenced by thermal, electrical, physical and thermomechanical requirements of the device and its surrounding electrical system and by the environment to which the device will be exposed. The reliability of the finished device and electric system will depend not only on the characteristics of the individual materials but also on the interaction of package and thermal management materials at interfaces during exposure to such stresses as thermal gradients, temperature cycling, moisture, and contamination. This chapter will introduce general characterization methodologies of thermal management materials for assessing performance and reliability of electronic packaging, including thermal properties, electrical properties, thermomechanical analysis, as well as material microstructure and interface characterization, surface finish and contact interface compatibility, and reliability analysis and environmental evaluation.

Keywords

Atomic Force Microscope Solder Joint Test Piece Thermal Management Electronic Packaging 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Laird TechnologiesSchaumburgUSA

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