Abstract
Test vectors are generated for post manufacturing test of a digital system. Because of the complexity of digital systems, the size of necessary tests, and test quality factors, automatic methods are used for generation of test patterns. This process is referred to as automatic test pattern generation (ATPG). For a circuit under test (CUT), test pattern generation must be due to the testing of the circuit as thoroughly as possible, and in the shortest possible time.
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Navabi, Z. (2011). Test Pattern Generation Methods and Algorithms. In: Digital System Test and Testable Design. Springer, Boston, MA. https://doi.org/10.1007/978-1-4419-7548-5_5
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DOI: https://doi.org/10.1007/978-1-4419-7548-5_5
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