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The Principles of STEM Imaging

  • Peter D. Nellist
Chapter

Abstract

The principles underlying imaging in the scanning transmission electron microscope are described. Particular focus is made on bright-field and annular dark-field imaging modes to illustrate the difference between coherent and incoherent imaging. In the case of annular dark-field imaging, the effects of dynamical diffraction and thermal diffuse scattering are discussed. The extension to three-dimensional imaging by optical sectioning is included, with particular reference to resolution limits and the bounds of transfer.

Keywords

Scanning Transmission Electron Microscope Detector Plane Bloch Wave Partial Coherence Scanning Transmission Electron Microscope Imaging 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

The author would like to thank the many colleagues and collaborators that have been involved in furthering our understanding of STEM imaging. P.D.N. acknowledges support from the Leverhulme Trust (F/08749/B), Intel Ireland, and the Engineering and Physical Sciences Research Council (EP/F048009/1).

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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Department of MaterialsUniversity of OxfordOxfordUK

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